RPReference Plant
Reference-cost benchmarking · synthetic peer set

Standardized cost-per-unit benchmarking for semiconductor manufacturing.

Raw wafer cost conflates manufacturing performance with factor-cost geography and equipment vintage. Reference Plant re-costs each process module at common reference factor prices — isolating how a fab is run from where it sits and how old its tools are — for like-for-like comparison across fabs, technology generations and regions.

Methodology originated at Infineon Technologies and generalized across manufacturing verticals.

Why raw cost-per-unit is not comparable

Raw cost ranks by geography, not by performance

Two fabs running the same 28 nm process at different sites can differ several-fold on raw wafer cost, driven predominantly by labour and electricity prices rather than manufacturing performance. Direct comparison of raw cost is therefore not meaningful.

At reference factor prices the ranking inverts: the higher-yield, newer-equipment fab is the lower-cost operation once labour and energy geography is removed.

Raw € / good wafer

Dresden (DE)
3,356
Kulim (MY)
2,369

Standardized € / good wafer

Dresden (DE)
2,822
Kulim (MY)
2,911

Source: 28 nm logic; reference factor prices €35/h, €0.12/kWh. Productivity indicators vary 3–5× across comparable fabs: Leachman & Hodges (1996). Synthetic peer set · calibrated to public benchmarks.

How standardization works

How standardization works

01

Re-cost the physical activity

Take the plant's reference route — labour-minutes, energy-kWh, equipment and material euros per wafer for its product — the part that is physics, not price.

02

Price it at one reference

Value that same activity at reference factor prices (€35/h labour, €0.12/kWh energy). Local labour and energy context is removed.

03

Read the normalization bridge

A waterfall from actual to standardized €/unit shows exactly how much of the gap is geography and how much is equipment vintage.

Operational KPIs, modelled with realistic correlations

Die yield

% good dies / wafer

Defect density D₀

defects / cm²

Equipment OEE

A × P × Q

Cycle time

days / mask layer

WIP turns

throughput / WIP

DPPM

ppm shipped

Calibrated to public benchmarks

The peer set is synthetic — generated, not measured — but it isn't invented. Distributions, correlations and factor-price ranges are calibrated to the canonical public literature, so the numbers behave the way a fab benchmarking expert expects.

Read the methodology

Your real data would never leave your control

For paying customers we build client-side encryption: your KPIs are encrypted in your browser before storage, keyed from a secret we never see. This demo stores only synthetic data — the architecture is laid out in full.

See the architecture